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October 1, 1985Journal of the Optical Society of America B

Charge emission and precursor accumulation in the multiple-pulse damage regime of silicon

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Authors

YJY. K. JheeMBMF BeckerRWR. M. Walser

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Jhee et al. (1985) studied this question.

synapsesocial.com/papers/6a70169a31a3df8243285da5https://doi.org/10.1364/josab.2.001626
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