A simple, rugged, and reliable apparatus for the measurement of contact potential differences (in the future abbreviated CPD) by a modified Kelvin method is described. The null circuit using a 6F5 as electrometer tube has a sensitivity of 0.5-cm scope deflection/mv of CPD/cm2 sample area, which permits the CPD to be determined to 1/100 volt for samples with surface areas as small as two square millimeters. The apparatus was developed for the study of surface characteristics of metals.
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Meyerhof et al. (1946) studied this question.
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