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An automated ferroelectric hysteresis loop tracer, developed using an INTEL 8085 microprocessor is described. This setup can be used to study the growth of a hysteresis curve at any desired temperature instantaneously after the application of a field. Since the setup allows the storage of data for each cycle of the applied field, this can be used to study the response of ferroelectric domains in an applied alternating field with time on unpoled or poled samples. The setup is interfaced with a personal computer to obtain directly the values of loop parameters.
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Dias et al. (1994) studied this question.
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