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Crystalline surfaces have been examined in the reflexion electron microscope with the angles of illumination and viewing adjusted so that diffracted electrons contributed to the images. In this way, the size and distribution of the diffracting regions have been determined. A resolution of 80 Å has been obtained, which is at least four times better than that obtained in normal reflexion micrographs.
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Halliday et al. (1960) studied this question.
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