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June 15, 1998Applied Physics Letters

High definition aperture probes for near-field optical microscopy fabricated by focused ion beam milling

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Authors

JVJ.A. VeermanInternational Commission for the Hydrology of the Rhine BasinAOA.M. OtterFirmenich (Switzerland)LKL. KuipersDelft University of Technology

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Veerman et al. (1998) studied this question.

synapsesocial.com/papers/6a7063d535aa2c282ce1b33ehttps://doi.org/10.1063/1.121564
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