Regulation of Industrial Process For Non-Invasive Scanning Instrumentation—A Novel Approach

Despite the diversity in application of spectroscopic techniques ranging from pharmaceutical industries, food and beverage or petrochemical industries; scientific data produced by these instrument is still limited in accuracy and errors associated with the luminescence. Unlike Chemical Force Microscopy (CFM), non-invasive instrumentation provides reliable and precise control in Industrial Process Regulation (IPR), where a chemical compound is always a point-of-care. Additionally, growing trends in analytical instrumentation towards Lab-On-a-Chip (LOC) has shift the manufacturer’s emphasis on sensitivity as well as robustness. Though expensive, but imaging spectrometer characterize a process or an object over a large range of luminescence such as Visual, Ultra-Violet (UV), Near Infra-Red (NIR), Infra-Red (IR), and Raman, to name a few.