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In this work, we describe the homo- and hetero-epitaxial growth of hexagonal and cubic Mg x Zn 1− x O thin films on lattice matched substrates of c-Al 2 O 3 , ZnO, MgO and SrTiO 3 . The crystalline quality, composition and epitaxial nature of the alloy films are obtained by x-ray diffraction and Rutherford backscattering spectroscopy (RBS) techniques. The RBS channeling yields are in the range 3–8% for homoepitaxial and hetero-epitaxial thin films. The metal–semiconductor–metal and ultraviolet detectors were fabricated on hexagonal and cubic Mg x Zn 1− x O thin films and the leakage current and UV-visible rejection ratio are correlated with the epitaxial relationship between the film and substrates.
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Hullavarad et al. (2007) studied this question.
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