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February 1, 1971Journal of Applied Physics

Photoinjection into SiO2: Electron Scattering in the Image Force Potential Well

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Authors

CBC. N. BerglundUniversity of GothenburgRPRoy PowellNIHR Clinical Research Network

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Berglund et al. (1971) studied this question.

synapsesocial.com/papers/6a7075b4f44fa9f079de1ca2https://doi.org/10.1063/1.1660066
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Also Consider

Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context:

  1. 1Interface Barrier Energy Determination from Voltage Dependence of Photoinjected Currents1970 · 305 citations
  2. 2Photoinjection into SiO2: Use of Optical Interference to Determine Electron and Hole Contributions1969 · 106 citations
  3. 3Fermi Level Position at Metal-Semiconductor Interfaces1964 · 480 citations
  4. 4Photoemission of Electrons from Silicon into Silicon Dioxide1965 · 444 citations
  5. 5SURFACE STATES ON SEMICONDUCTOR CRYSTALS; BARRIERS ON THE Cd(Se:S) SYSTEM1965 · 57 citations