Films of Al2O3 sandwiched between thin metal electrodes have been irradiated using continuous radiation from a cobalt target x-ray tube operated at 35 kV. Current through the A12O3 films was measured as a function of voltage and time during x-irradiation. Implications of these measurements regarding radiation induced charge trapping in oxide films are discussed.
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R. S. Lee (1970) studied this question.
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