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December 1, 1982Journal of The Electrochemical Society

Single Crystal Silicon Films on Amorphous Insulators: Growth by Lateral Nucleated Epitaxy Using Scanning Laser and Electron Beams and Evaluation by Electron Backscattering Contrast

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Authors

TST. O. SedgwickIBM (United States)RGRoy H. GeissColorado State UniversitySDS.W. DeppIBM (United States)

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Sedgwick et al. (1982) studied this question.

synapsesocial.com/papers/6a709c76e71d69abee08b8dbhttps://doi.org/10.1149/1.2123682
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