In this paper, we propose an optimization methodology to design low-temperature polycrystalline-silicon thin-film transistors (LTPS TFTs) for submicrometer ultralow-power digital operation. LTPS TFTs incur low fabrication cost and can be fabricated on a variety of substrates (flexible such as polymer, glass, etc.). LTPS TFT has significantly reduced mobility, resulting in reduced driving current; however, we show that, for ultralow-power subthreshold operation (Vddth) , LTPS TFTs can be optimized to achieve comparable performance as a single-crystalline silicon (c-Si) silicon-on-insulator (SOI). For LTPS TFTs with TS112cm-2) after hydrogenation with less dynamic energy consumption under isostatic power consumption compared to a c-Si SOI MOSFET. We also address the inherent variations in grain boundaries at device and circuit levels to gain practical insights.
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Li et al. (2007) studied this question.
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