A reliability study has been made on 0.98 μm InGaAs/GaAs strained quantum well ridge waveguide lasers for pumping erbium-doped fiber optical amplifiers (EDFAs). Analysis of a constant power long-term aging test over 104 h shows that the degradation rate is proportional to the square root of the aging time irrespective of operating output power. A simple relationship is found between degradation rate and both operation current density and optical density. The change in light-current characteristics and emission wavelength during constant current aging are also investigated. It is found that emission wavelength exhibits a blue shift for an identical operation current accompanied by laser degradation due to an increased threshold carrier density. In constant-power mode aging, on the other hand, the shift is found to be rather complicated because of an additional factor of an increase in junction temperature causing a red shift. The influence of the wavelength shift on amplification characteristics in EDFAs is also discussed.
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Okayasu et al. (1992) studied this question.
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