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April 1, 1982Journal of Applied Physics

Diffraction efficiency and decay times of free-carrier gratings in silicon

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Authors

HEH. J. EichlerTechnische Universität BraunschweigFMF. MassmannUniversity of Bonn

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Eichler et al. (1982) studied this question.

synapsesocial.com/papers/6a7108d93ce530166bc2fed3https://doi.org/10.1063/1.331025
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