An improved method is described of measuring the temperature in a thermomagnetically written bit. It uses the temperature shift of absorption in the storage material to deduce the temperature from transmission changes measured during the application of a thermal pulse. The transmission kinetics which were measured in a film of EuO for several energy pulses supplied by a GaAs laser are presented. By fitting these curves to those generated by a computer program simulation of the experiment, details of the temperature profile within the bit are revealed. For moderate power levels, about half of the power absorbed by the bit is retained by it in the first 400 nsec, while radial losses do not produce significant thermal spreading in the same time period.
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Wieder et al. (1971) studied this question.
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