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July 1, 1968Journal of Applied Physics

The Nature of Thermally Induced Stresses in Silicon and Their Relation to Observed X-Ray Diffraction and Birefringence Phenomena

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Authors

GCG. CarronEuropean Organization for Nuclear ResearchLWL. K. WalfordSAGE Publishing (United States)

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Carron et al. (1968) studied this question.

synapsesocial.com/papers/6a712ccbf44fa9f079def55dhttps://doi.org/10.1063/1.1656858
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Also Consider

Synapse has enriched 3 closely related papers on similar clinical questions. Consider them for comparative context:

  1. 1Comparison of X-Ray Topography and Infrared Birefringence for Investigating Thermal Stresses in Silicon1967 · 5 citations
  2. 2INFRARED BIREFRINGENCE OBSERVATIONS ON ELECTRON-BOMBARDED SILICON1966 · 7 citations
  3. 3Infrared Studies of Birefringence in Silicon1959 · 59 citations