The purpose of this paper is to present a novel Pseudo-Floating-Gate Flash EEPROM cell which has certain advantages over the classical structure and, therefore, it seems adequate for multi-MBit memory arrays as well as for CMOS embedded memory applications. The proposed cell is based on the series resistance modification concept and exhibits the following characteristics: 1) simplicity, 2) dimensions as small as a MOSFET, 3) the ability to follow the shrink rate of CMOS devices, 4) the ability to be easily embedded in CMOS, 5) low-power compatibility, and 6) insensitivity to depletion phenomena. All these features make this device very attractive for future NVM applications.
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Papadas et al. (1997) studied this question.
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