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We report on the layer thickness dependence of Ni 2p core-level line shapes of epitaxially grown, in a layer-by-layer fashion, NiO on a single-crystal MgO (100) substrate. The results demonstrate the sensitivity of the core-level line shape to the nearest as well as next-nearest-neighbor coordination number. The results are consistent with a recent theoretical study of nonlocal screening effects. {} 1996 The American Physical Society.
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Alders et al. (1996) studied this question.
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