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September 1, 1956Bell System Technical Journal

The Use of an Interference Microscope for Measurement of Extremely Thin Surface Layers

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WBW. L. BondJames S. McDonnell FoundationFSF. M. SmitsUtrecht University

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Bond et al. (1956) studied this question.

synapsesocial.com/papers/6a71411226a7f98052dda3achttps://doi.org/10.1002/j.1538-7305.1956.tb03825.x
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