This is the authors' abstract. We don't add key points for this paper.
Views Icon Views Article contents Figures & tables Video Audio Supplementary Data Peer Review Share Icon Share Twitter Facebook Reddit LinkedIn Tools Icon Tools Reprints and Permissions Cite Icon Cite Search Site Citation Y. Kudriavtsev, R. Asomoza, K. D. Moiseev; Response to “Comment on ‘Restoration of the original depth distribution from the SIMS profile using the depth resolution function in framework of RMR model’” [J. Vac. Sci. Technol. B 41, 024003 (2023)]. J. Vac. Sci. Technol. B 1 September 2023; 41 (5): 056001. https://doi.org/10.1116/6.0002810 Download citation file: Ris (Zotero) Reference Manager EasyBib Bookends Mendeley Papers EndNote RefWorks BibTex toolbar search Search Dropdown Menu toolbar search search input Search input auto suggest filter your search All ContentAVS: Science & Technology of Materials Interfaces and ProcessingJournal of Vacuum Science & Technology B Search Advanced Search |Citation Search
Answers are grounded in this paper and cite their sources.
No takes yet. Share an insight, caveat, or question.
Kudriavtsev et al. (2023) studied this question.
Synapse has enriched 10 related papers. Consider them for comparative context: