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May 25, 1987Applied Physics Letters

Photothermal and photoconductive determination of surface and bulk defect densities in amorphous silicon films

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Authors

ZSZ E. SmithAT&T (United States)VCV. ChuVirginia Commonwealth UniversityKSKimberly B. ShepardLonza (Switzerland)

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Smith et al. (1987) studied this question.

synapsesocial.com/papers/6a71a79f5d37378ac1debf70https://doi.org/10.1063/1.97819
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