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January 1, 1978Journal de physiqueOpen Access

Influence of interface charges on transport measurements in amorphous silicon films

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Authors

ISI. SolomonCentre National de la Recherche ScientifiqueTDT. DietlPolish Academy of SciencesDKD. KaplanUniversity of Georgia

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Solomon et al. (1978) studied this question.

synapsesocial.com/papers/6a71a7bd75498292b70b108dhttps://doi.org/10.1051/jphys:0197800390110124100
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