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August 1, 1965International Journal of Electronics

Measurement of Flexure in Silicon Wafers by the Lang X-ray Diffraction Technique†

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Cite This Study

E. M. Juleff (1965) studied this question.

synapsesocial.com/papers/6a71a87735aa2c282ce2dce6 https://doi.org/10.1080/00207216508937810

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