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January 1, 1992Surface and Interface Analysis

Probing depth of soft x‐ray absorption spectroscopy measured in total‐electron‐yield mode

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Authors

MAM. AbbateJGJ. B. GoedkoopFGFrank M. F. de Groot

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Abbate et al. (1992) studied this question.

synapsesocial.com/papers/6a71b48926a7f98052ddee4bhttps://doi.org/10.1002/sia.740180111
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