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Because of the similarity between photoelectric yield and photoabsorption spectra in the soft x-ray region, "yield spectroscopy" can be used as a successful method for investigating fine structure in the electronic excitation spectra of solids. The continuous spectrum of synchrotron radiation is especially appropriate for such measurements. We reinvestigated the structure of the $4d$ excitations in Pr and the $2p$ excitations of Si using a single crystal.
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Gudat et al. (1972) studied this question.
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