Optical data are presented relating the photoluminescence emission of GaAs : Ge epitaxial layers with hole concentrations in the range from 6 × 1016 to 2.7 × 1019 cm−3. These data are supplemented with electroluminescence results obtained using diodes where the p side of the junction consists of GaAs : Ge. Measurements reported include the peak position of the electroluminescence and photoluminescence peaks, half-intensity bandwidths, and radiative efficiency at room temperature.
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Kressel et al. (1973) studied this question.
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