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Liquid structures on solid substrates have been imaged with a resolution in the nanometer range by scanning force microscopy in the tapping mode. Using Substrates with an artificially patterned wettability, characteristic features in the three-phase contact line were induced, which allow the contact line tension to be determined. The values in the range of -1 x 10-10 N obtained for sessile droplets of hexaethylene glycol arc consistent with theoretical predictions.
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Pompe et al. (1999) studied this question.
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