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A comparatively simple procedure was developed for measuring the impedance representation of a wave-guide obstacle. The Smith chart location of the impedance representation of the obstacle is derived from voltage measurements at two fixed probe positions. This technique was applied to the case of a thin inductive post of indium antimonide at 77°K. The electrical properties of the post material were inferred from the impedance using the concepts of Part I. Large impedance charges attributable to the pinch effect agreed with theoretical predictions over a small range of applied electric field values.
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Larrabee et al. (1965) studied this question.
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