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The roles of ions and neutral active species in microwave plasma etching are investigated. Silicon wafers are etched in a mixture discharge. The results of three different experiments agree and are suggestive of the following: Si wafers can be etched only when ions impinge on the wafer surface at pressures lower than 0.13 Pa , Si wafers are etched by neutral active species at pressures higher than 1.3 Pa , and both by ions and neutral active species at pressures between 0.13 Pa and 1.3 Pa .
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Suzuki et al. (1979) studied this question.
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