Reduced phases of ultrathin rutile TiO(2)(110) grown on Ni(110) have been characterized with scanning tunneling microscopy and low-energy electron diffraction. Areas of 1 x 2 reconstruction are observed as well as {132} and {121} families of crystallographic shear planes. These phases are assigned by comparison with analogous phases on native rutile TiO(2)(110).
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Papageorgiou et al. (2007) studied this question.
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