An experimental powerful methodology is proposed to evaluate and quantify the anisotropy and strength of the different pinning contributions of YBa2Cu3O7−x coated conductors by combining angular dependent in-field critical current measurements in the whole temperature range. A clear separation between isotropic and anisotropic pinning centers and a further classification into weak and strong pinning centers are performed. These analyses envision to establish a correlation between defect microstructure and critical currents which is essential for artificial engineering high-performance nanostructured coated conductors.
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Gutiérrez et al. (2007) studied this question.
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