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September 1, 1962British Journal of Applied Physics

Method of preparing Si and Ge specimens for examination by transmission electron microscopy

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Authors

GBG. R. BookerSiemens (Germany)RSR. SticklerUniversity of Vienna

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Booker et al. (1962) studied this question.

synapsesocial.com/papers/6a72bcc6b27f158178281ce4https://doi.org/10.1088/0508-3443/13/9/303
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  1. 1The preparation of thin films of germanium and silicon1961 · 21 citations
  2. 2Summarized proceedings of a conference on electron microscopy - Exeter, July 19591960 · 5 citations
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  5. 5Electrolytic Shaping of Germanium and Silicon1956 · 1,112 citations