A specimen section is described for the Siemens Elmiskop I electron microscope, capable of cooling the illuminated area of transmission specimens to below 10°K and tiling by 7° in any direction. Coolant flows through the specimen holder by way of flexible tubing, which allows tilting and tranverse movement of the holder. The temperature is measured by means of superconducting materials and by condensation of various gases on the specimen. Data of measured beam current on the specimen and the resultant temperature rise are reported.
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Valdrè et al. (1965) studied this question.
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