The resolution in scanning transmission electron microscopy may be enhanced by taking advantage of the information contained in the nanodiffraction patterns recorded for each position of the scanning incident beam. We have demonstrated the first production of ultrahigh resolution, better than 0.1 nm, by this method, in the imaging of an essentially one-dimensional object, the wall of a multiwalled carbon nanotube, using an instrument for which the resolution for normal imaging is about 0.3 nm.
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Cowley et al. (2001) studied this question.