We report application of a near-real-time method to determine layer thickness on electroplated coin blanks. The method was developed on a simple laser-induced-breakdown spectroscopy (LIBS) arrangement by monitoring relative emission-line intensities from key probe elements via successive laser ablation shots. This is a unique LIBS application where no other current spectroscopic method (inductively coupled plasma or x-ray fluorescence) can be applied effectively. Method development is discussed, and results with precalibrated coins are presented.
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Asimellis et al. (2007) studied this question.
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