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This study gives a characterisation using X-rays of variations in texture and microstructure of copper billets obtained by the ECAE (Equal Channel Angular Extrusion) process. Billets were produced using the so-called route C with an extrusion angle of 120° It is shown that a significant texture gradient is observed through the width of the ECAE processed billet. In addition, we demonstrate that the amount of micro-strain and the size of the coherently diffracting domains depend on which peak of a given family of planes is investigated as well as on the exact location in the sample.
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Tidu et al. (2000) studied this question.
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