Vanadium pentoxide (V 2 O 5 ) thin films have been produced by pulsed laser deposition. AFM, Raman, optical and electrical measurements have been made on the films in order to understand the growth mechanism of laser ablated V 2 O 5 thin films. The investigations revealed the growth of stoichiometric and high-quality V 2 O 5 thin films at low substrate temperatures. The optical band gap and the electrical conductivity of V 2 O 5 thin films grown at a temperature of 200 °C at an oxygen partial pressure of 100 mTorr are 2.35 eV and 10 -4 S cm -1 , respectively.
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Ramana et al. (2001) studied this question.
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