Although deterioration of the magnetic characteristics of silicon steel due to shearing stress has been observed, the degree of deterioration has not previously been assessed quantitatively. With the recent development of a technique for measuring the microscopic distribution of flux density, the effects of stress on flux distribution can now be investigated quantitatively. In this paper the deterioration of the magnetization curve of nonoriented silicon steel due to shearing stress is examined.
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Nakata et al. (1992) studied this question.
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