The magnetic and magnetoresistive properties of films having spin valve structures were investigated. The basic structure of such films consists of two ferromagnetic layers separated by a Cu layer. One of the ferromagnetic layers is strongly biased by an NiO antiferromagnetic film in direct exchange contact with it. Spin valve films having an NiO/NiFe/Cu/NiFe structure exhibit good sensitivity, and the MR ratio (Δρ/ρ) is 4% in an applied field of 10 Oe. Films with a layered NiO/NiFe/Cu/NiFe/Cu/NiFe/NiO structure have an MR ratio of 7% in a field of 10 Oe. On the other hand, NiO/NiFe/Co/Cu/Co/NiFe films exhibit an MR ratio of 6% to 7.5%. The thermal stability of spin valve films was also studied.
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Hoshiya et al. (1994) studied this question.
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