Dielectric loss tanδ is an essential source of noise in pyroelectric detectors. In reflecting on the dielectric loss of thin chips made from modified triglycine sulphate (TGS), it has been found out and experimentally shown that surface effects and electrothermal coupling effects cause a considerable increase in dielectric loss. The publication gives data on temperature and frequency dependence of dielectric loss, depending on mounting, chip thickness, surface treatment regime, and electrode patterning technique.
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Neumann et al. (1992) studied this question.