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August 1, 1989Journal of Applied Crystallography

RAD, a program for analysis of X-ray diffraction data from amorphous materials for personal computers

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VPV. PetkovUniversity of Strathclyde

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V. Petkov (1989) studied this question.

synapsesocial.com/papers/6a75675b1078cf7de2b215ea https://doi.org/10.1107/s0021889889002104

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