X-ray reflectivity and adsorption isotherm study of fractal scaling in vapor-deposited films

We have carried out x-ray reflectivity and adsorption measurements on thermally evaporated silver and gold films deposited onto substrates held at 80, 300, and 500 K to investigate whether the surfaces of such films are fractal in nature. Both techniques indicate self-affine fractal scaling for Ag films deposited at near-normal incidence onto substrates held at 80 K.