The reliability of a quantitative comparison of contrast between experimental and simulated strong-beam transmission electron microscope images depends on an accurate determination of a number of parameters. It is shown that, by recording simultaneous bright-field and dark-field images, the main sources of uncertainty in such an analysis, namely the crystal potential and the absorption parameter, can be reduced substantially. This technique has been employed in order to determine the rigid-body translation across {110} antiphase boundaries in GaAs, by analysis of strong-beam α fringes.
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Rasmussen et al. (1991) studied this question.
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