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This work pertains to output voltage stability of soft adjacent layer biased magnetoresistive heads with abutted permanent magnetic films for domain stabilization. A micromagnetic model has been developed to study the effect of the permanent magnet film microstructure and the micromagnetic properties of the abutted junction interface on head stability. The impact on head stability is analyzed with respect to interfacial ferromagnetic coupling across the junction interface and intergranular exchange coupling in the permanent magnet films among other film properties.
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Zhu et al. (1996) studied this question.
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