An investigation of exchange coupling mechanism in a double film formed of the amorphous Co1−xTix and polycrystalline Co1−x−yPtxTiy layer is reported. The thin films were prepared by rf diode sputtering. The amorphous layer presents the characteristics of a soft ferromagnet (Hc<1Oe) and an in-plane induced uniaxial anisotropy Hk. The CoPtTi hard layer exhibits a large Hc. The exchange mechanism was characterized by the shift Hs of the in-plane hysteresis loop, and by ferromagnetic resonance measurements. The effect of interface contamination by oxygen upon the interfacial exchange constant is pointed out.
No takes yet. Share an insight, caveat, or question.
Ounadjela et al. (1988) studied this question.
Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context: