The cross-section profiles in krypton and xenon have been measured for one- and two-electron excitations of the type ns²np⁶(¹S₀)→nsnp⁶(²S1/2)mp or ns²np⁶(¹S₀)→ns²np⁴(³P,¹D,¹S)mlm^'l^'. These cross sections were assumed to have the form ${σ}(E)=C(E)+{Σ}{}{i}{(E{-}{E}ᵢ)({{{Γ}}ᵢ}{2}){a}ᵢ+{({{{Γ}}ᵢ}{2})}²{b}ᵢ}{{(E{-}{E}ᵢ)}²+{({{{Γ}}ᵢ}{2})}²},$ where the adjustable parameters $C(E)$, ${b}ᵢ$, ${a}ᵢ$, ${E}ᵢ$, and ${{Γ}}ᵢ$ were determined by a least-squares unfolding process which separated the smearing effect of the monochromator slit from the true optical density. Parameter values and cross-section curves are given for 12 krypton resonances and 11 xenon resonances.
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D. L. Ederer (1971) studied this question.
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