Two apparatus have been developed for time-resolved measurements of x-ray diffraction patterns using an imaging plate detector. The first one is based on a cinema method which permits up to 40 exposures of a two-dimensional x-ray pattern (100×108 mm2) with a 0.3-s time resolution. The second one works as a 200-mm-long linear detector which enables a time resolution of 23 μs for a duration of up to 46 ms, based on a streak-camera method. These apparatus have no count rate limitation, a high detective quantum efficiency (more than 80% for 8–20 keV), a 1:105 dynamic range in x-ray intensity and a spatial resolution of 150 μm (FWHM) due to the performance of the imaging plate.
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Amemiya et al. (1989) studied this question.
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