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Second-harmonic reflection from Si(100) and Si(111) surfaces exhibits a strong dependence on the angle of rotation of the sample about its surface normal. This behavior can be related directly to the structural symmetry of the crystal and of the surface. Analysis of the results shows that the surface and bulk contributions to the observed second-harmonic signals from Si are generally of the same order of magnitude.
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Tom et al. (1983) studied this question.
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