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By adapting a scanning force microscope to operate at frequencies above the highest tip–sample resonance, the sensitivity of the microscope to materials’ properties is greatly enhanced. The cantilever’s behavior in response to high-frequency excitation from a transducer underneath the sample is fundamentally different than to its low-frequency response. In this article, the motivations, instrumentation, theory, and first results for this technique are described.
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Burnham et al. (1996) studied this question.
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