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January 1, 1964IBM Journal of Research and Development

Nondestructive Determination of Thickness and Refractive Index of Transparent Films

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Authors

WPW. A. PliskinIBM (United States)ECEdward E. ConradGeorgia Institute of Technology

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Pliskin et al. (1964) studied this question.

synapsesocial.com/papers/6a765f9cbd133bc944bc4e0ehttps://doi.org/10.1147/rd.81.0043
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