Wear and gouge formation in brittle faulting

Research Article| June 01, 1987 Wear and gouge formation in brittle faulting Christopher H. Scholz Christopher H. Scholz 1Lamont-Doherty Geological Observatory, Department of Geological Sciences, Columbia University, Palisades, New York 10964 Search for other works by this author on: GSW Google Scholar Geology (1987) 15 (6): 493–495. https://doi.org/10.1130/0091-7613(1987)15<493:WAGFIB>2.0.CO;2 Article history first online: 02 Jun 2017 Cite View This Citation Add to Citation Manager Share Icon Share Facebook Twitter LinkedIn MailTo Tools Icon Tools Get Permissions Search Site Citation Christopher H. Scholz; Wear and gouge formation in brittle faulting. Geology 1987;; 15 (6): 493–495. doi: https://doi.org/10.1130/0091-7613(1987)15<493:WAGFIB>2.0.CO;2 Download citation file: Ris (Zotero) Refmanager EasyBib Bookends Mendeley Papers EndNote RefWorks BibTex toolbar search Search Dropdown Menu toolbar search search input Search input auto suggest filter your search All ContentBy SocietyGeology Search Advanced Search Abstract Considerable amounts of data indicate that the thickness of the gouge zone for brittle faults increases linearly with total slip. This implies that gouge is produced continuously and at a steady rate as faulting progresses. A simple model of wear which accounts for gouge formation predicts a constant thickness/slip ratio for a given rock type and normal stress. The model is compared with measurements of gouge production in friction-sliding experiments, and there is satisfactory agreement. Natural faults have higher wear rates than found in the experiments, probably because of their greater roughness. Estimates are also made of the fraction of the energy of faulting that goes into gouge production, and it is found to be 10−3–10−4 of the frictional work in both the experimental and natural cases. The model predicts that fault zones should thicken with depth in simple cases. This content is PDF only. Please click on the PDF icon to access. First Page Preview Close Modal You do not have access to this content, please speak to your institutional administrator if you feel you should have access.